Fast Static Compaction of Test Sequences using Implications and Greedy Search

Current paper presents a new technique for static compaction of sequential circuit tests that are divided into independent test sequences. The technique implements effective representation of fault matrices by weighted bipartite graphs. The approach contains a preprocessing step for determining the set of essential vectors. Subsequently, implications and a greedy search algorithm is applied. The proposed method offers significantly faster performance in terms of run times than earlier, genetic algorithm based methods. Moreover, the average compaction provided by current method is better.